Extended reach inspection apparatus

ABSTRACT

An extended reach inspection apparatus may include a scanner device and a robotic manipulator arm. The robotic manipulator arm may include a plurality of arm segments including a distal end arm segment and a proximal end arm segment. A movable joint may couple the distal end arm segment to the robotic manipulator arm. A telescoping extension mechanism may be coupled to the distal end arm segment. The scanner device is mounted to the telescoping extension mechanism for moving the scanner device between a retracted position proximate the robotic manipulator arm and an extended position at a distance from the robotic manipulator arm. A control handle may be coupled to the proximal end arm segment of the plurality of arm segments for manipulating the robotic manipulator arm.

CROSS REFERENCE TO RELATED APPLICATIONS

The present application is a divisional application of U.S. applicationSer. No. 14/803,758, filed Jul. 20, 2015 (now U.S. Pat. No. 9,939,411)which is a continuation-in-part application of U.S. application Ser. No.13/547,190, filed Jul. 12, 2012 (now U.S. Pat. No. 9,086,386). Thecontents of both are hereby incorporated herein by reference in theirentirety.

FIELD

The present disclosure relates to nondestructive inspection/evaluation(NDI/NDE), and more particularly to an extended reach apparatus andsensors used in NDI/NDE that detect defects in structures and parts.

BACKGROUND

Increases in the complexity of aerospace structures have made NDI/NDE,which terms are used interchangeably herein, more and more difficult toapply successfully and cost-effectively. Often, a region of a particularstructure requires inspection, but is inaccessible for the applicationof conventional NDE methods. In some cases, inspection requirements ofregions with limited access have prompted part removal to improveaccess, or expensive redesigns altogether. Conventional tools includeextenders and manipulation arms to reach into limited access areas andto aid probe placement on or near limited access areas of aircraft. Suchareas may be cavities or obstructed areas, and include, for example, theinterior of aircraft wings.

When in operation, certain sensors for detection of defects in a surfaceare preferably seated on the surface, or at least require maintaining nomore than a maximum clearance from the surface. When a sensor, forexample an eddy current sensor, is not completely seated on the surface,which may be referred to as “lift-off,” the result may be a reducedsensitivity to small cracks.

A sensor may be applied to a surface that is not completely flat andrequire movement of the probe along the surface, or may be mounted to arotating end of a probe for NDE in limited access areas. Either case mayresult in lift-off. For the rotating application, if the probe end isnot exactly perpendicular to the surface to be inspected, the rotatingpath of the sensor will be eccentric; although the sensor may be flushwith the surface at one point along the path, at an opposite point onthe path (or some other location) there will be lift-off. Accordingly,an apparatus is needed that addresses lift-off to provide adequatesensitivity for detection of defects over the full range of motion ofthe sensor.

SUMMARY

In accordance with an embodiment, an extended reach inspection apparatusmay include a scanner device and a robotic manipulator arm. The roboticmanipulator arm may include a plurality of arm segments including adistal end arm segment and a proximal end arm segment. A movable jointmay couple the distal end arm segment to the robotic manipulator arm. Atelescoping extension mechanism may be coupled to the distal end armsegment. The scanner device is mounted to the telescoping extensionmechanism for moving the scanner device between a retracted positionproximate to the robotic manipulator arm and an extended position at adistance from the robotic manipulator arm. A control handle may becoupled to the proximal end arm segment of the plurality of arm segmentsfor manipulating the robotic manipulator arm.

In accordance with another embodiment, an extended reach inspectionapparatus may include a robotic manipulator arm and a scanner device.The scanner device is coupled to the robotic manipulator arm. Thescanner device may include a probe having a longitudinal axis, a firstend, and a second, free end defining an opening, wherein the opening isoffset from the longitudinal axis. The scanner device may also include asensor for inspecting a target and providing an electrical output. Thesensor is received in the opening and when the probe is rotated aboutthe longitudinal axis, the sensor moves in a substantially circularpath. The scanner device may additionally include a bias means receivedin the opening in-between the first end of the probe and the sensor tourge the sensor away from the first end of the probe.

In accordance with another embodiment, a method may include inserting arobotic manipulator arm through at least one inspection port of anenclosed structure. The robotic manipulator arm may include a pluralityof arm segments and a telescoping extension mechanism coupled to adistal end arm segment of the plurality of arm segments. A scannerdevice is mounted to the telescoping extension mechanism for moving thescanner device between a retracted position proximate to the roboticmanipulator arm and an extended position at a distance from the roboticmanipulator arm for performing an inspection. The method may alsoinclude operating a movable joint that couples the distal segment to therobotic manipulator arm to position the scanner relative to a componentfor performing the inspection. The method may additionally includemoving the telescoping extension mechanism to position the scanner overthe component for performing the inspection.

In accordance with an embodiment and any of the previous embodiments,the telescoping extension mechanism may include a base platform. Thescanner device may be coupled to one side of the base platform and atrack follower may be mounted to an opposite side of the base platform.The telescoping extension mechanism may also include a telescopeextension track mounted to the distal end arm segment of the roboticmanipulator arm. The track follower is configured to move along thetelescope extension track between the retracted position and theextended position. The telescoping extension mechanism may also includea motor that moves the track follower along the telescope extensiontrack. The controller controls the motor to move the scanner devicebetween the retracted position and the extended position.

In accordance with an embodiment and any of the previous embodiments,the distal end arm segment may include a stationary portion coupled tothe robotic manipulator arm by the movable joint and a rotatable portionrotationally coupled to the stationary portion. The distal end armsegment includes a longitudinal axis defined through the stationaryportion and the rotatable portion. The rotatable portion is rotatableabout the longitudinal axis relative to the stationary portion. Theextended reach inspection apparatus may also include an indexing featurefor determining an angle of rotation of the rotatable portion relativeto the stationary portion.

In accordance with an embodiment and any of the previous embodiments,the extended reach apparatus may also include a midspar supportapparatus configured to support the robotic manipulator arm between twospars of an enclosed structure. The midspar support apparatus mayinclude a head fitting configured to releasably attach to an inspectionport support member and the inspection port support member may bereleasably attachable to a first inspection port in a first spar. Themidspar support apparatus may also include a plurality of collapsibleleg members extending from the head fitting. The plurality ofcollapsible leg members may be configured to contact a second sparopposite the first spar. The plurality of collapsible leg members arecollapsible to fit through a second inspection port in the second spar.

Other aspects and features of the present disclosure, as defined solelyby the claims, will become apparent to those ordinarily skilled in theart upon review of the following non-limited detailed description of thedisclosure in conjunction with the accompanying figures.

BRIEF DESCRIPTION OF THE DRAWINGS

The following detailed description of embodiments refers to theaccompanying drawings, which illustrate specific embodiments of thedisclosure. Other embodiments having different structures and operationsdo not depart from the scope of the present disclosure.

FIG. 1 is an example of an NDI/NDE system and side view of an example ofa robotic manipulator arm of the NDI/NDE system including a scannerdevice with a probe in accordance with an embodiment of the presentdisclosure.

FIG. 2A is a side view of the scanner device mounted to a telescopingextension mechanism of the exemplary robotic manipulator arm with thetelescoping extension mechanism in a retracted position in accordancewith an embodiment of the present disclosure.

FIG. 2B is a side view of the scanner device mounted to the telescopingextension mechanism of the exemplary robotic manipulator arm with thetelescoping extension mechanism in an extended position and a springbiased portion of the base platform in an uncompressed position inaccordance with an embodiment of the present disclosure.

FIG. 2C is a side view of the scanner device mounted to the telescopingextension mechanism of the exemplary robotic manipulator arm with thetelescoping extension mechanism in the extended position and springbiased portion of the base platform in a fully compressed position inaccordance with an embodiment of the present disclosure.

FIG. 3A is a side view of the distal end arm segment of the exemplaryrobotic manipulator arm showing a first index mark on a rotatableportion of the distal end arm segment for positioning the distal end armsegment in a home position in accordance with an embodiment of thepresent disclosure.

FIG. 3B is a side view of the distal end arm segment of the exemplaryrobotic manipulator arm showing the first index mark on the rotatableportion and a second index mark on a stationary portion of the distalend arm segment being aligned for positioning the rotatable portion inabout a 90 degree position with respect to the stationary portion inaccordance with an embodiment of the present disclosure.

FIG. 4 is a perspective view of an exposed portion of an interior of anenclosed structure illustrating application of the exemplary roboticmanipulator arm of FIG. 1.

FIG. 5 is a perspective view of an exposed portion of an interior of anenclosed structure between the two spars showing an example of a midsparsupport apparatus in accordance with an embodiment of the presentdisclosure.

FIG. 6A is a perspective view of a back side of an example of aninspection port support member for use with a midspar support apparatusin accordance an embodiment of the present disclosure.

FIG. 6B is a perspective view of a front side of the exemplaryinspection port support member of FIG. 6A.

FIG. 7A is a perspective view of the exemplary robotic manipulator armof FIG. 1 arranged in a first configuration for inspecting elements of aback side of a spar in accordance with an embodiment of the presentdisclosure.

FIG. 7B is a perspective view of the exemplary robotic manipulator armof FIG. 1 arranged in a second configuration for inspecting elements ofa front side of a spar in accordance with an embodiment of the presentdisclosure.

FIG. 8 is a front end perspective view of an example of a scanner deviceincluding a probe in accordance with an embodiment of the presentdisclosure.

FIG. 9 is a side view of an example of a probe in accordance with anembodiment of the present disclosure.

FIG. 10 is a side perspective view of the exemplary probe of FIG. 9.

FIG. 11 is another side perspective view of the exemplary probe of FIG.9.

FIG. 12 is a bottom perspective view of the exemplary probe of FIG. 9.

FIG. 13 is a side perspective view of the exemplary scanner deviceincluding a probe of FIG. 8.

FIG. 14 is an example of a high frequency eddy current impedance planedisplay that may result from application of the exemplary probe of FIG.9 in inspecting an aluminum structure in accordance with an embodimentof the present disclosure.

FIG. 15 is an example of a high frequency eddy current impedance planedisplay that may result from application of the exemplary probe of FIG.9 in inspecting a titanium structure in accordance with anotherembodiment of the present disclosure.

DETAILED DESCRIPTION

The following detailed description of embodiments refers to theaccompanying drawings, which illustrate specific embodiments of thedisclosure. Other embodiments having different structures and operationsdo not depart from the scope of the present disclosure. Like referencenumerals may refer to the same element or component in the differentdrawings.

Certain terminology is used herein for convenience only and is not to betaken as a limitation on the embodiments described. For example, wordssuch as “proximal”, “distal”, “top”, “bottom”, “upper,” “lower,” “left,”“right,” “horizontal,” “front,” “back,” “vertical,” “upward,” and“downward” merely describe the configuration shown in the figures orrelative positions. The referenced components may be oriented in anydirection and the terminology, therefore, should be understood asencompassing such variations unless specified otherwise.

FIG. 1 is an example of an NDI/NDE system 10 including an example of anextended reach inspection apparatus 11 in accordance with an embodimentof the present disclosure. The extended reach inspection apparatus 11may include a robotic manipulator arm 12 and an end effector 15. The endeffector 15 may include a scanner device 14 with an inspection probe 16.The scanner device 14 may include any type of NDI/NDE inspection orscanning device, such as for example an eddy current inspection device,ultrasonic inspection device, x-ray inspection device or other NDI/NDEinspection device. The probe 16 may include, for example, an eddycurrent sensor, a magnetic sensor, an ultrasonic sensor, or otherNDI/NDE type sensor. The robotic manipulator arm 12 may include aplurality of arm segments 18-22. In the example robotic manipulator arm12 shown in FIG. 1, the plurality of arm segments may include a distalend arm segment 18, a proximal end arm segment 20 and one or moreintermediate arm segments 22 a, 22 b and 22 c. The exemplary roboticmanipulator arm 12 shown in FIG. 1 includes three intermediate armsegments 22 a-22 c. Other embodiments may include more or lessintermediate arm segments depending on the application or environment.The arm segments 18-22 c may be coupled to one another by multi-axismovable joints 24 a, 24 b, 24 c, 24 d and 24 e. The multi-axis movablejoints 24 a-24 e allow the arm segments 18-22 c to be articulatedrelative to one another as illustrated in FIGS. 7A and 7B. Eachmulti-axis movable joint 24 a-24 e may permit the respectively coupledarm segments 18-22 c to be positioned at different angles relative toone another. The multi-axis movable joints 24 a-24 e may also permit thecoupled arm segments 18-22 c to be rotated relative to one another. Forexample, multi-axis movable joint 24 a may be a universal joint orU-joint that allows the angle of the robotic manipulator arm 12 todiffer a certain number of degrees from the proximal end arm segment 20that is releasably attachable to an access hole or port as describedwith reference to FIG. 4. Multi-axis joints 24 b and 24 c may each be amotorized elbow joint that may permit the respectively joined armsegments to be positioned at different angles between about 0 degreesand about 90 degrees. Joint 24 d may be a rotating joint that rotatesarm segment 22 c at different angles between about 0 degrees and about180 degrees clockwise or counterclockwise about a longitudinal axis 19that may be defined through the robotic manipulator arm 12 asillustrated in FIG. 1 with all arm segments 22 a-22 c extendinglinearly. Multi-axis joint 24 e may be motorized elbow joint that maypermit the distal end arm segment 18 to be positioned at differentangles between about 0 degrees and about 90 degrees relative to the armsegment 22 c.

The movable joints 24 a-24 e may be motorized joints and may be remotelycontrolled by a controller 26. An electrical cable 28 may operativelyconnect the controller 26 to the proximal end arm segment 20 of therobotic manipulator arm 12 to supply electrical power and controloperation of the robotic manipulator arm 12. The electrical cable 28 mayinclude electrical power wiring and control wiring for each of themovable joints 24 a-24 e. The electrical cable 28 may also includesignal wiring for controlling operation of the scanner device 14 and fortransmitting electrical signals to and from the scanner in response toperforming an inspection by the inspection probe 16 on a target orcomponent similar to that described herein. Electrical power wiring andsignal wiring may extend through an interior of the robotic manipulatorarm 12 for controlling operation of the movable joints 24 a-24 e and thescanner device 14 and for transmitting signals responsive to theinspection tests. An end of electrical cable 28 may include a suitableplug 28 a as best shown in FIG. 4 that may be plugged into a mattingreceptacle 29 on the proximal end arm segment 20.

The controller 26 may include a plurality of control devices ormanipulators 30 a, 30 b, 30 c, etc., such as rotatable dials, joy sticksor other types of control devices, for controlling the movable joints 24a-24 e for articulating and rotating the arm segments 18-22 c forpositioning the scanner device 14 and inspection probe 16 for inspectionof a component or target as described herein.

The robotic manipulator arm 12 may also include a control handle 32coupled to the proximal end arm segment 20 for manipulating the roboticmanipulation arm 12. The control handle 32 may be used by an operatorfor positioning and adjusting placement of the robotic manipulator arm12 for performing inspections.

The NDI/NDE system 10 may also include a probe camera monitor 34. Asdescribed in more detail herein with reference to FIG. 8, a probe camera36 may be associated with the scanner device 14 for positioning theinspection probe 16 relative to a component or target for inspection.The probe camera 36 may be video camera. The probe camera 36 may beincorporated within the scanner device 14 or may be an integralcomponent of the scanner device 14 as illustrated by the probe camera 36being shown by a broken line in FIG. 1. Images from the probe camera 36may be viewed on the probe camera monitor 34 for manipulating therobotic manipulation arm 12 for positioning the inspection probe 16relative to a target or component for inspection. A centerline of theprobe camera 36 is parallel to a centerline of the probe 16 but offset apreset distance. The probe camera 36 may then be disposed directly overa target or component being inspected, such as a fastener connectingparts of an aircraft wing or other parts as viewed by an operator on theprobe camera monitor 34. The robotic manipulator arm 12 may then beadjusted the preset distance in a predetermined direction to directlycenter the inspection probe 16 over the fastener for inspecting thefastener and an area around a circumference of the fastener.

NDI/NDE system 10 may also include a wide angle camera 38 and a wideangle camera monitor 40. The wide angle camera 38 may be coupled to anarticulating arm 42. The articulating arm 42 may position the wide anglecamera 38 for use in configuring the robotic manipulator arm 12 forinspection of a component or target.

The distal end arm segment 18 may include a stationary portion 18 a androtatable portion 18 b that is rotationally coupled to the stationaryportion 18 a. The longitudinal axis 19 may be defined through thestationary portion 18 a and the rotatable portion 18 b. The rotatableportion 18 b is rotatable about the longitudinal axis 19 relative to thestationary portion 18 a. A motorized rotation joint 24 f may rotate therotatable portion 18 b between about 0 degrees and about 180 degreesclockwise or counterclockwise relative to the stationary portion 18 a.The motorized rotation joint 24 f may be remotely controlled by thecontroller 26.

The robotic manipulator arm 12 may also include a telescoping extensionmechanism 44 coupled to the distal end arm segment 18 of the roboticmanipulator arm 12. The telescoping extension mechanism 44 may beattached to the rotatable portion 18 b of the distal end arm segment 18.The scanner device 14 is mounted to the telescoping extension mechanism44 for moving the scanner device 14 between a retracted positionproximate the robotic manipulator arm 12 and an extended position at adistance from the robotic manipulator arm 12 for performing aninspection similar to that described herein. Referring also to FIGS.2A-2C, FIG. 2A is a side view of the scanner device 14 mounted to thetelescoping extension mechanism 44 of the exemplary robotic manipulatorarm 12 with the telescoping extension mechanism 44 in a retractedposition in accordance with an embodiment of the present disclosure.FIG. 2B is a side view of the scanner device 14 with the telescopingextension mechanism 44 in an extended position. The telescopingextension mechanism 44 may include a base platform 46. The scannerdevice 14 may be coupled to one side of the base platform 46. The baseplatform 46 may include a stationary portion 46 a and a spring biasedportion 46 b. The spring biased portion 46 b may be configured to sliderelative to the stationary portion 46 a and resiliently compress asillustrated in FIG. 2C when the inspection probe 16 is in contact with acomponent or target during an inspection to maintain contact between theinspection probe 16 and the component when performing an inspection.

A track follower 48 is mounted to an opposite side of the base platform46. The scanner device 14 may be attached to the spring biased portion46 b of the base platform 46 and the track follower 48 may be mounted tothe stationary portion 46 a of the base platform 46. The track follower48 may include a first segment 48 a and a second segment 48 b. Atelescope extension track 50 is mounted to the rotatable portion 18 b ofthe distal end arm segment 18 of the robotic manipulator arm 12. Thetrack follower 48 is configured to move along the telescope extensiontrack 50 between the retracted position and the extended position.

The telescoping extension mechanism 44 also includes a motor 52 thatmoves the track follower 48 along the telescope extension track 50. Themotor 52 may be mounted to the stationary portion 46 a of the baseplatform 46 at a predetermined distance from the spring biased portion46 b to permit compression of the spring biased portion 46 b when theinspection probe 16 is in contact with a component or target forperforming an inspection. The controller 26 (FIG. 1) may control themotor 52 to move the scanner device 14 between the retracted position asshown in FIG. 2A and the extended position as shown in FIG. 2B. Themotor 52 may drive a wheel, a gear or other arrangement (not shown inFIGS. 2A-2B) that may engage the telescope extension track 50 for movingthe scanner device 14 between the retracted position and the extendedposition. For example, the telescope extension track 50 may include arack gear and the motor 52 may drive a pinion gear for moving thescanner device 14 between the positions.

An electrical cable 54 may be connected between the stationary portion18 a of the distal end arm segment 18 and the telescoping extensionmechanism 44 and the rotatable portion 18 b of the distal end armsegment 18. The electrical cable 54 may include a first plug 56 a thatconnects to electrical wiring in the stationary portion 18 a of thedistal end arm segment 18. As previously described, electrical powerwiring and signal wiring may extend through the interior of the roboticmanipulator arm 12 for controlling operation of the scanner device 14,telescoping extension mechanism 44 and multi-axis movable joints 24 a-24f. The electrical cable 54 may also include a second plug 56 b forelectrically connecting to a receptacle 58 on the stationary portion 46a of the base platform 46 adjacent to the motor 52. The electrical cable54 is of a sufficient length to allow the rotatable portion 18 b of thedistal end arm segment 18 to rotate a predetermined angle of rotationrelative to the stationary portion 18 a and for the telescope extensionmechanism 44 to extend to the extended position. For example, therotatable portion 18 b may be rotated between about 0 degrees and atleast about 180 degrees clockwise and counterclockwise relative to thestationary portion 18 a.

Referring also to FIGS. 3A and 3B, the extended reach inspectionapparatus 11 may include an indexing feature 60 for determining an angleof rotation of the rotatable portion 18 b of the distal end arm segment18 relative to the stationary portion 18 a. FIG. 3A is a side view ofthe distal end arm segment 18 showing a first index mark 62 at apredetermined location on the rotatable portion 18 b of the distal endarm segment 18 for positioning the distal end arm segment 18 in a homeposition in accordance with an embodiment of the present disclosure.FIG. 3B is a side view of the distal end arm segment 18 showing thefirst index mark 62 aligned with a second index mark 64 at apredetermine location on the stationary portion 18 a for positioning therotatable portion 18 b in a 90 degree position with respect to thestationary portion 18 a in accordance with an embodiment of the presentdisclosure. Accordingly, the rotatable portion 18 b is at a first angleof rotation relative to the stationary portion 18 a when the first indexmark 62 and the second index mark 64 are aligned and the rotatableportion 18 b is at a second angle of rotation relative to the stationaryportion 18 a, for example 90 degrees, when the first index mark 62 andthe second index mark 64 are not aligned.

FIG. 4 is a perspective view of an exposed portion of an interior of anenclosed structure 66 illustrating application of the exemplary roboticmanipulator arm 12 of FIG. 1. The enclosed structure 66 may be aninterior portion of an aircraft, such as a wing or other flight controlsurface that has limited accessibility except through inspection portsor holes. For example, the enclosed structure 66 may be a midspan of awing or other portion of an aircraft between a first spar 68 and secondspar 70. The robotic manipulator arm 12 may be extended through a firstaccess hole or port 72 in the first spar 68 into the enclosed structure66. The access hole or port 72 is large enough for the distal end armsegment 18 of the robotic manipulator arm 12 and the scanner device 14to pass through. In one embodiment the access hole or port 72 may beapproximately five inches in diameter. A support bracket 74 may bemounted in the opening 72 to support the proximal end arm segment 20 ofthe robotic manipulator arm 12.

The robotic manipulator arm 12 may also be extended through at least asecond access hole or inspection access port 76 in the second spar 70. Amidspar support apparatus 78 may be inserted and deployed in theenclosed structure 66 between the first spar 68 and the second spar 70to support the robotic manipulator arm 12. Referring also to FIG. 5,FIG. 5 is a perspective view of the exposed portion of the interior ofthe enclosed structure 66 of FIG. 4 between the two spars 68 and 70showing an example of the midspar support apparatus 78 in accordancewith an embodiment of the present disclosure. An inspection port supportmember 80 may be releasably attached to the second inspection accessport 76 in the second spar 70 to support the robotic manipulator arm 12extending through the second inspection access port 76. The inspectionport support member 80 may protect the second inspection access port 76and second spar 70 from damage. An example of the inspection portsupport member 80 will be described in more detail with reference toFIGS. 6A and 6B. The midspar support apparatus 78 may include a headfitting 82 configured to releasably attach to the inspection portsupport member 80 that is releasable attachable to the inspection accessport 76 in the second spar 70. The midspar support apparatus 78 may alsoinclude a plurality of collapsible leg members 84 a, 84 b and 84 cextending from the head fitting 82. The plurality of collapsible legmembers 84 a, 84 b and 84 c may be configured to contact the first spar68 opposite the second spar 70. The plurality of collapsible leg member84 a, 84 b and 84 c may each be adjustable in length and may eachinclude a locking mechanism 86 to retain each leg at a selected length.The plurality of collapsible leg members 84 a, 84 b and 84 c may becollapsible to fit through the first inspection access port 72 in the inthe first spar 68.

A protective pad 88 may be disposed between the first spar 68 and thesecond spar 70. The protective pad 88 may also be extendable over a face91 of the first spar 68. The protective pad 88 protects the interiorarea of the enclosed structure 66 between the first spar 68 and thesecond spar 78 and the face of the first spar 68 from damage duringinstallation and removal of the midspar support apparatus 78 and therobotic manipulator arm 12 during an inspection procedure. For aninterior area that is within an aircraft, aircraft components, such aswings and other flight control surfaces may be manufactured from alightweight honeycomb sandwich structure including a cellular layerincluding a multiplicity of honeycomb shaped cells disposed orsandwiched between an inner layer of material and outer layer ofmaterial. The honeycomb sandwich structure may be damaged if impacted bythe robotic manipulator arm 12 or midspar support apparatus 78.

Referring also to FIGS. 6A and 6B, FIG. 6A is a perspective view of aback side of an example of the inspection port support member 80 for usewith the midspar support apparatus 78 in accordance an embodiment of thepresent disclosure. FIG. 6B is a perspective view of a front side of theinspection port support member 80 of FIG. 6A. The inspection portsupport member 80 may include a substantially rectangular shaped mainbody 89 with a flat top portion 90 to extend across the inspectionaccess port 76 as shown in FIGS. 4 and 5. The robotic manipulator arm 12may rest on the flat top portion 90 and slide along the flat top portion90 between appendages 92 a and 92 b during an inspection procedure.Appendage 92 a and 92 a may extend from the main body 89 at oppositeends of the flat top portion 90. The appendages 92 a and 92 b mayprevent the robotic manipulator arm 12 from striking an interior theinspection access port 76 opening and causing damage when the roboticmanipulator arm 12 moved or positioned for performing an inspection.

The inspection port support member 80 may also include a substantiallysemi-circular shaped lip 94 extending from the flat top portion 90 (FIG.6A). The semi-circular shaped lip 94 is configured to matingly contactor releasably attach to an interior lower edge of the second inspectionaccess port 76. The semi-circular lip 94 may have an upside down J-shapeor may be hook shaped to releasably attach to or hang over the interiorlower edge of the second inspection access port 76.

The inspection port support member 80 may also include a threadedopening 96. The threaded opening 96 may be configured to matinglyreceive a screw 98 (FIG. 5) captured by the head fitting 82 forattaching the inspection support member 80 to the midspar supportapparatus 78.

FIG. 7A is a perspective view of the exemplary robotic manipulator arm12 of FIG. 1 arranged in a first configuration for inspecting elementsof a back side 700 of a spar 702 in accordance with an embodiment of thepresent disclosure. FIG. 7B is a perspective view of the exemplaryrobotic manipulator arm 12 of FIG. 1 arranged in a second configurationfor inspecting elements of a front side 704 of a second spar 706 inaccordance with an embodiment of the present disclosure. As illustratedin FIGS. 7A and 7B, the distal end arm segment 18 and the intermediatearm segments 22 b and 22 c may be articulated by the multi-axis movablejoints 24 b, 24 c and 24 d for inspecting different components ortargets within an enclosed structure, such as an interior or an aircraftwing or other structure.

FIG. 8 is an end perspective view of the scanner device 14, whichincludes an embodiment of an inspection probe 16 mounted to the scannerdevice 14. In this embodiment, the inspection probe 16 may include aneddy current sensor 100, including a coil of wire. The scanner device 14may be a micro eddy current rotating scanner, which may include a motor.It is not necessary for other embodiments of the system 10 (FIG. 1) orthe inspection probe 16 that the scanner device 14 be a rotating type.The distal end of the scanner device 14 may include lights 102, forexample LEDs, to illuminate the enclosure and the target to beinspected, and a camera lens 104 to provide an image to the probe camera36 (FIG. 1) in the scanner device 14. Another video camera could also bemounted in proximity of the inspection probe 16 to provide additionalsituational awareness. A knob 106 has a threaded bolt 109 on it that maybe loosened to remove the scanner device 14 from the base platform 46 ofthe telescoping extension mechanism 44 (FIGS. 1-2C). The other end ofthe threaded bolt 109 may bear against a cylinder (not shown in FIG. 8)to which the scanner device 14 is attached.

A tether 107 may be looped around the threaded bolt 109 of the knob 106and another end of the tether 107 may be secured to the inspection probe16. The scanner device 14 may include a scanner body 200. The inspectionprobe 16 may extend from the scanner body 200 on a rotating shaft 202 orspindle. The inspection probe 16 is removable from the scanner device 14and may be dislodged from the scanner body 200 if the inspection probe16 strikes an object during insertion or removal of the roboticmanipulator arm 12 during an inspection procedure. The tether 107connects the probe 16 to the scanner body 200 to prevent loss of theprobe within an interior of a structure under inspection. The tether 107will retain the inspection probe 16 with the scanner body 200 inresponse to the inspection probe 16 being pulled from the scanner device14. In accordance with an embodiment, a collar 204 may be attached tothe shaft 202. The collar 204 may include a groove 206 for receiving andretaining the tether 107. The tether 107 may be looped around the groove206 in the collar 107 and fastened to retain the tether 107 within thegroove 206. In another embodiment, the collar 107 may be a bearingfastened to the shaft 202 with a groove in an exterior portion of thebearing. The bearing allows the shaft 202 to rotate within the bearingand the tether 107 fastened within the groove in the exterior portion ofthe bearing is allowed free movement or to remain stationary as theshaft 202 rotates during performance of an inspection.

FIGS. 9-12 show an embodiment of the inspection probe 16 with anembodiment of an eddy current sensor 100. The inspection probe 16 mayinclude a spindle 110, a central member 112 mounted to the spindle 110,and a housing 114 mounted to the central member 112. In this embodiment,the housing 114 is translucent. The sensor 100 may be received in anopening which may be a bore 120 in the housing 114 or be otherwiseslidably mounted to the housing 114. The central member 112 may bemounted to the spindle 110 with a set screw 122 (FIG. 11). The housing114 may be cylindrical, may encase the sides of the central member 112,and extends distally below the bottom of the central member 112. Belowthe distal end of the central member 112 the housing 114 may define asubstantially cylindrical opening 124 and have a cylindrical wall 126.The cylindrical wall 126 may be of adequate thickness to receive thesensor 100 in the bore 120 in the wall 126, as shown, or otherconfigurations may be provided to attach the sensor 100 to theinspection probe 16. In the example shown in FIG. 9, the inspectionprobe 16 may be configured for inspecting the metal 902 around afastener 904 of a component of a structure 906, such as an aircraft wingor other structure. The opening 124 in the housing 114 is large enoughto receive the end of the fastener 904 that protrudes from thestructure.

A spring 130, such as a coil spring as schematically shown, a leafspring, compressible and resilient material, or other biasing means maybe provided in between the proximal end of the bore 120 and the proximalend of the sensor 110, and urges the sensor 100 distally such that thesensor 100 may extend out of the bore 120 past the distal surface 132 ofthe housing 114. The spring loading increases the probe's compliance tothe surface of the structure 906 under inspection. Seating of the eddycurrent sensor 100 over the fastener so that the sensor 100 lies as flatas possible on the structure 906 is generally desirable for conducting aproper inspection. The sensor 100 is retained in the bore 120 with a pin134 that extends laterally through an opening 136 in the housing wall126 and passes through a slot 138 in the sensor 100. The proximal side140 of the slot 138 is blocked by the pin 134 as the spring 130 urgesthe sensor 100 to withdraw from the bore 120. The proximal side 140 ofthe slot 138 is located such that the sensor 100 may extend apredetermined distance X from the bore 120 below the distal surface 132of the housing 114.

In addition, a joint 142 may be provided in the spindle 110 at theconnection to the central member 112. The joint 142 may be, for example,a gimbal joint, a ball and socket type joint, or the like, and in theembodiment of an inspection probe 16 described herein, may allow for adeflection of, for example, at least approximately 12 degrees, with apreferred angle of at least 15 degrees between the spindle 110 and thelongitudinal axis of the inspection probe 16. Joint deflection may begreater with other embodiments, and particularly in embodiments wherethe sensor 100 can extend a greater predetermined distance X from thebore 120 below the distal surface 132 of the housing 114 than in theexemplary embodiment described herein.

The joint 142 may be designed to transfer scan rotation through an angleas needed, but to return to a zero angle position when the end is free,which may be referred to as self-aligning. This self-aligning may beaccomplished in a variety of ways, for example in a ball and socket typejoint, using a non-spherical ball and socket that pulls slightly out andextends an inner spring when an angle away from the longitudinal axis ofthe inspection probe 16 is created. The spindle 110 and joint 142 rotateduring scanning, as does the rest of the inspection probe 16.

In one exemplary embodiment, the inside diameter of the housing 114 is0.5 inches, the housing wall 126 thickness distally from the centralmember 112 is 0.112 inches, the radius from the longitudinal axis of theinspection probe 16 to the longitudinal axis of the sensor 100 is 0.183inches, and the predetermined distance X that the sensor 100 may extendpast the distal surface 132 of the housing 114 is 0.008 inches.

The probe materials may include, for example, for the central member112, spindle 110, spring 130, and pin 134, metals such as steel,stainless steel, or other steel alloy. The housing 114 may be moldedplastic or other nonconductive material, which may be translucent tofacilitate assembly and visualization of a fastener during scanning. Thesensor 100 may be made of materials as known to one of ordinary skill inthe art.

FIG. 13 shows a detail view of the end effector 15 or scanner device 14in use. Angle θ is the predetermined deflection angle that the joint 142provides. As shown, the joint 142 allows a deflection of approximately15 degrees between the spindle 110 and the longitudinal axis Y-Y of theinspection probe 16. The distance that the sensor 100 can extend pastthe distal surface 132 of the housing 114 makes this relatively highdegree of deflection possible. When the inspection probe 16, and thesensor 100 with it, rotates when the housing 114 is not parallel to thetarget surface, there will be one point on the path of rotation wherethe distal surface 132 of the housing 114 is closest to the target,preferably with the sensor 100 touching the target surface, and a pointon the opposite side of the path of rotation where the distal surface132 of the housing 114 is farthest away from the target surface, andwithout the extension of the sensor 100 lift-off will be experienced.The extending of the sensor 100 past the distal surface 132 of thehousing 114 reduces the amount of lift-off or eliminates lift-off, andmay keep the sensitivity of the sensor 100 adequate to providemeaningful NDE data over the entire path of rotation. The sensor 100extending also allows the deflection angle to be increased in the designof the joint 142. An increased available deflection angle facilitatesapplying and using the inspection probe 16.

FIG. 14 shows a high frequency eddy current impedance plane display 150as may result from application of an inspection probe 16 including aneddy current sensor 100 applied to an aluminum structure. This display150 may aid an operator/inspector in knowing when the inspection probe16 is coupled to the structure to allow proper inspection. Resistance isplotted on the X-axis and Reactance is plotted on the Y-axis. The eddycurrent probe is “nulled” in air, which appears on the display 150 atthe far left at the label “AIR” where there is no magnetic fieldmeasurement, as opposed to the often used technique of nulling theinspection probe 16 while on the part being inspected, and then, as theinspection probe 16 is brought down over the fastener 902, the eddycurrent display “dot” comes down to the position where the inspectionprobe 16 is coupled with the part or structure 906.

Curve A in FIG. 14 represents decreasing magnetic field readings fromright to left, which corresponds to increased lift-off from right toleft. Multiple flaw indications are shown in FIG. 14. These flawindications are curves B through F, which are each the result of thesensor 100 detecting the same 0.050 inch deep Electrical DischargeMachining (EDM) notch, but with different distances of lift-off. Thecurves B through F are also labeled with dimensions that designate thedistance of lift-off in inches for each of the respective curves. Toobtain a desirable 3:1 signal-to-noise ratio (S/N), in testing with theexample discussed above in the discussion of FIGS. 9-12, the lift-off ofthe sensor 100 from the part could not be more than 0.016 inches. Below0.016 inch lift-off, the inspection probe 16 and structure 906 wasconsidered to be coupled. If the lift-off was greater than this amount,the flaw indication may be detectable, but the S/N was less thandesirable and it may become difficult to distinguish a crack in the partfrom lift-off.

In a test with an eddy current sensor mounted to a probe without aspring to extend the sensor out of the housing, and a spindle with ajoint allowing an angle of incidence of 10.5 degrees off of a lineperpendicular to the target surface, the dot traveled along curve Aapproximately within range G as the sensor rotated. With a spring thatallowed the sensor to extend 0.008 inches out of the housing, the jointangle could be increased to 15 degrees, and the dot traveledapproximately only within range H, providing improved ability toaccurately detect flaws.

There are some significant differences between aluminum and titaniumstructures when eddy current testing for surface flaws. Titaniumelectrical conductive is significant less than aluminum. This requires amuch different coil driver frequency, which generate the eddy currentsin the structure, to detect the surface flaw. These driver frequenciesin titanium are much higher, which causes the eddy currentdepth-of-penetration to be significantly less, and detection of thecrack more sensitive to different amounts of lift-off, or coil distanceslifted-off the surface of the structure.

FIG. 15 shows a high frequency eddy current impedance plane display 160as may result from application of an inspection probe 16 including aneddy current sensor 100 applied to a titanium structure. Each of thecurves in FIG. 15 are labeled with dimensions that designate thedistance of lift-off in inches from a surface of the structure. FIG. 14shows the flaw amplitude decreasing with increasing amounts of lift-offof the coil for the aluminum structure. FIG. 15 shows the flaw amplitudedecreasing with increasing amounts of lift-off of the coil for thetitanium structure. As shown in FIG. 14 the amount of lift-off forroughly a 50% decrease in amplitude is 0.016-inches, where in FIG. 15the amount of lift-off for roughly a 50% decrease in amplitude is0.008-inches. Also, it can be seen that in aluminum (FIG. 14) that alift-off of 0.032-inches can still detect the flaw, where with titaniumthe maximum amount of lift-off to detect the flaw is 0.016-inches.

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of the disclosure.As used herein, the singular forms “a”, “an”, and “the” are intended toinclude the plural forms as well, unless the context clearly indicatesotherwise. It will be further understood that the terms “comprises”and/or “comprising,” when used in this specification, specify thepresence of stated features, integers, steps, operations, elements,and/or components, but do not preclude the presence or addition of oneor more other features, integers, steps, operations, elements,components, and/or groups thereof.

Although specific embodiments have been illustrated and describedherein, those of ordinary skill in the art appreciate that anyarrangement which is calculated to achieve the same purpose may besubstituted for the specific embodiments shown and that the embodimentsherein have other applications in other environments. This applicationis intended to cover any adaptations or variations of the presentdisclosure. The following claims are in no way intended to limit thescope of the disclosure to the specific embodiments described herein.

What is claimed is:
 1. A method of performing an inspection, comprising: inserting a robotic manipulator arm through at least one inspection port of an enclosed structure, the robotic manipulator arm comprising a plurality of arm segments and a telescoping extension mechanism coupled to a rotatable portion of a distal end arm segment of the plurality of arm segments, wherein the rotatable portion is rotationally coupled to a stationary portion of the distal end arm segment, a longitudinal axis being defined through the stationary portion and the rotatable portion, the rotatable portion being rotatable about the longitudinal axis relative to the stationary portion, and wherein a scanner device is mounted to the telescoping extension mechanism for moving the scanner device between a retracted position proximate the robotic manipulator arm and a extended position at a distance from the robotic manipulator arm for performing an inspection; operating a movable joint that couples the distal segment to the robotic manipulator arm to position the scanner relative to a component for performing the inspection; and moving the telescoping extension mechanism to position the scanner over the component for performing the inspection.
 2. The method of claim 1, further comprising: inserting a midspar support apparatus through a first inspection port in a first spar, the midspar support apparatus being configured to support the robotic manipulator arm between the first spar and a second spar of an enclosed structure; releasably attaching an inspection port support member to a second inspection port in the second spar, the inspection port support member being attached to the midspar support apparatus; and expanding a plurality of collapsible leg members of the midspar support apparatus that extend from the inspection port support member, the plurality of collapsible leg members being configured to contact the first spar opposite the second spar and being collapsible to fit through the first inspection port.
 3. The method of claim 2, disposing a protective pad between the first spar and the second spar and over a face of the first spar to protect an interior area of the enclosed structure between the first spar and the second spar and the face of the first spar from damage during installation and removal of the midspar support apparatus and the robotic manipulator arm during an inspection procedure.
 4. The method of claim 2, further comprising extending the robotic manipulator arm through at least the second inspection port in the second spar for performing the inspection.
 5. The method of claim 2, further comprising; releasably attaching a support bracket to the first inspection port in the first spar; and supporting a proximal end arm segment of the robotic manipulator arm using the support bracket.
 6. The method of claim 2, wherein each of the collapsible leg members comprise and adjustable length and a locking mechanism to retain each collapsible leg member at a selected length, the method further comprising: adjusting the length of each collapsible leg member of the midspar support apparatus so that the midspar support apparatus extends between the first spar and the second spar; and locking each of the collapsible leg members at the selected length.
 7. The method of claim 2, wherein the inspection port support member comprises: a main body, the main body comprising a flat top portion that extends across a particular inspection port when releasably attached to the particular inspection port; a first appendage; and a second appendage, the first appendage and the second appendage each extend from the main body on opposite sides of the flat top portion, wherein the robotic manipulator arm slides across the flat top portion between the first appendage and the second appendages during an inspection procedure and the flat top portion and the first and second appendage prevent damage to the particular inspection port and the robotic manipulator arm during an inspection procedure.
 8. The method of claim 1, further comprising articulating the plurality of arm segments to extend the scanner device into limited access areas for performing inspections.
 9. The method of claim 1, further comprising: providing a probe extending from the scanner device, the probe comprising a longitudinal axis and including a first end and a second, free end defining an opening, wherein the opening is offset from the longitudinal axis, with bias means first inserted in the opening and then a sensor for inspecting a target; urging the sensor away from the first end of the probe using the bias means; and rotating the probe about the longitudinal axis to cause the sensor to move in a substantially circular path.
 10. The method of claim 9, further comprising limiting a range of movement of the sensor to retain part of the sensor in the opening and allow part of the sensor to extend out of the opening.
 11. The method of claim 9, wherein the robotic manipulator arm is operatively coupled to the first end of the probe, the method further comprising articulating the plurality of arm segments of the robotic arm to cause the probe to reach limited access areas.
 12. The method of claim 9, wherein the probe includes a gimbal joint or ball and socket type joint between the first end and the second, free end of the probe and a spindle operatively connected to the gimbal joint or ball and socket joint, the method further comprising providing available deflection of the probe longitudinal axis from the spindle of at least approximately 15 degrees.
 13. A method for performing an inspection, comprising: providing a robotic manipulator arm comprising a plurality of arm segments; providing a scanner device coupled to a distal end arm segment of the robotic manipulator arm, the scanner device comprising a probe having a longitudinal axis and including a first end and a second, free end defining an opening, wherein the opening is offset from the longitudinal axis, with bias means first inserted in the opening and then a sensor for inspecting a target; urging the sensor away from the first end of the probe using the bias means; and rotating the probe about the longitudinal axis to cause the sensor to move in a substantially circular path.
 14. The method of claim 13, further comprising articulating and rotating the arm segments relative to one another for positioning the scanner device for performing an inspection.
 15. The method of claim 13, further comprising mounting the scanner device to a telescoping extension mechanism for moving the scanner device between a retracted position proximate the robotic manipulator arm and an extended position at a distance from the robotic manipulator arm.
 16. The method of claim 15, further comprising providing a controller operatively connected to the robotic manipulator arm for controlling the telescoping extension mechanism to move the scanner device between the retracted position and the elongated position.
 17. The method of claim 15, further comprising: mounting the telescoping extension mechanism to a rotatable portion of the distal end arm segment of the robotic manipulator arm; and rotationally coupling the rotatable portion to a stationary portion of the distal end arm segment, a longitudinal axis being defined through the stationary portion and rotatable portion, wherein the rotatable portion is rotatable about the longitudinal axis relative to the stationary portion.
 18. The method of claim 13, further comprising coupling to the probe to a body of the scanner device by a tether, the tether retaining the probe with the scanner device in response to the probe being pulled from the scanner device.
 19. The method of 13, further comprising inserting a midspar support apparatus between two spars of an enclosed structure for performing an inspection procedure.
 20. A method for performing an inspection, comprising: providing a scanner device comprising an inspection probe; providing a robotic manipulator arm comprising a plurality of arm segments, wherein the plurality of arm segments comprise a distal end arm segment and a proximal end arm segment, wherein the distal end arm segment comprises: a stationary portion coupled to the robotic manipulator arm by a movable joint; a rotatable portion rotationally coupled to the stationary portion; and a longitudinal axis defined through the stationary portion and the rotatable portion, the rotatable portion being rotatable about the longitudinal axis relative to the stationary portion; articulating and rotating the arm segments relative to one another for positioning the scanner device for performing an inspection; coupling a telescoping extension mechanism to the distal arm segment, wherein the scanner device is mounted to the telescoping extension mechanism for moving the scanner device between a retracted position proximate the robotic manipulator arm and an extended position at a distance from the robotic manipulator arm, the telescoping extension mechanism being mounted on the rotatable portion of the distal arm segment; and providing a control handle coupled to the proximal end arm segment of the plurality of arm segments for manipulating the robotic manipulator arm. 